DX-30 Permanent Magnet Hall Effect Meter
DX-30 Permanent Magnet Hall Effect Meter Used to measure important parameters such as carrier concentration, mobility, resistivity, Hall coefficient and other important parameters. These parameters are necessary to understand the electrical properties of semiconductor materials, so the Hall effect test system is a necessary tool for understanding and studying the electrical properties of semiconductor devices and semiconductor materials.
We can provide various Hall effect test systems for teaching and research;
It is the largest manufacturer of high-precision Hall devices in China;
Technical support: Institute of Semiconductors, Chinese Academy of Sciences (Hall effect research for 30 years).
Parameters of DX-30 Permanent Magnet Hall Effect Meter:
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Physical parameters
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Carrier concentration
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10³cm⁻³ - 10²³cm⁻³
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Mobility
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0 .1 cm²/ volt*sec - 10⁸cm²/ volt*sec
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Resistivity range
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10-5 Ohm*cm - 107 Ohm*cm
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Hall voltage
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1 uV - 3V
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Hall coefficient
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10⁻⁵ - 10²⁷cm³/ C
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Testable material type
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Semiconductor material
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SiGe, SiC, InAs, InGaAs, InP,AlGaAs, HgCdTe and ferrite materials etc.
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low resistance material
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Graphene, metals, transparent oxides, weakly magnetic semiconductor materials, TMR materials, etc.
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high resistance material
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Semi-insulating GaAs, GaN, CdTe, etc.
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Material Conductive Particles
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Type P and Type N testing of materials
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Magnetic field environment
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Magnet Type
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Nuclear magnetic resonance NMR series permanent magnets
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Magnitude of magnetic field
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500mT (Pole head spacing: 18mm)
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Optional magnetic environment
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The electromagnet of relevant magnetic size can be customized according to the needs of customers
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Electrical parameters
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Current source
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50.00nA- 50.00mA
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Current source resolution
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0.0001uA
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Measuring voltage
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0 ~ ±3V
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Voltage measurement resolution
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0.0001 mV
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Other Accessories
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Shading
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Extern ally installed light-shielding parts make the test material more stable
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Sample size
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Maximum 30mm * 30mm
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Box cabinet
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600*600*1000mm
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Test piece
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Hall effect of Institute of Semiconductors, Chinese Academy of Sciences Standard test samples and data: 1 set
(Si, Ge, GaAs, lnSb) |
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Making ohmic contacts
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Electric soldering iron, indium chip, solder, enameled wire, etc.
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One-button automatic measurement can be performed without the need for human operation after the test is started
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The software can perform I-V curve and BV curve
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Set in software for automatic temperature measurement
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The experimental results are measured, and the data will be temporarily saved in the software. If long-term storage is required, the data can be exported to an EXCEL table to facilitate later data processing.
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Provide the Hall effect standard test samples and data of the Institute of Semiconductors, Chinese Academy of Sciences: 1 set
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Testable samples of hall effect apparatus:
Constituent parts
DX-30 Permanent magnet
1. Both ends are high-stability permanent magnets, and the magnetic field value is around 500mT (the specific value is subject to actual measurement);
2. The distance between the pole heads of the two permanent magnets is: 18mm, the pole diameter is: 48mm, and the pole surface diameter is: 33mm;
3. The permanent magnet is a nuclear magnetic resonance NMR series permanent magnet; it has good stability and a very uniform magnetic field, ensuring that the uniformity of the uniform area is 1~5*10-5;
4. Permanent magnets with relevant magnetic sizes can be customized according to customer needs to cooperate with Hall effect testing experiments.
DX-320 Sample constant current source
The DX-320 effect meter specially developed for this instrument system assembles a constant current source and a switch (a six-and-a-half microvoltmeter and a Hall-complex switching relay) into one. Greatly reduced the connection and operation of the experiment. The DX-320 can be used alone as a constant stream and a microvolt.
1. The basic resolution of current output is 0.0001uA, and the basic resolution of voltage measurement is 0.0001mV;
2. Output range: 50.00nA-50.00mA, the middle can be continuously adjusted in steps of 0.1nA;
3. Measurement voltage: 0~±3V, a wide range of test voltages that meet the test of high-resistance chips;
4. Built-in automatic conversion four-phase array card, which can realize automatic measurement of the Hall effect Vanderbilt method;
5. Good human-computer interaction interface, convenient for users to make manual adjustments;
6. Complete host computer instructions can communicate with the computer to complete various operations.
DX-35 Sample stage
Upper Machine Software
1. One-click automated measurement can be realized. After the test starts, the tester must follow the program prompts to reverse the polarity of the permanent magnet before measurement;
2. Set the parameters of relevant test samples in the software, and realize automatic calculation of each parameter after the test is completed;
3. I-V curves and B-V curves can be performed in the software;
4. The modular design within the software makes it convenient for customers to use and develop related functions;
5. After the experimental result measurement is completed, the data will be temporarily saved in the software. If long-term storage is required, the data can be exported to an EXCEL table to facilitate later data processing.
Supporting instrument
1. The permanent magnet fixing device allows the magnet to be fixed in the same position every time;
2. Provide Hall effect standard test samples and data from the Institute of Semiconductors, Chinese Academy of Sciences: 1 set;
3. Corresponding tools for making ohmic contact solder joints on samples: soldering iron, indium sheet, solder, enameled wire, etc.;
4. 232 to USB serial port cable to realize communication between the test instrument and the host computer software.
