DX-1000LHallEffect

DX-1000L Low Temperature Hall Effect Test System

DX-1000L Low Temperature Hall Effect Test System is used to measure important parameters such as carrier concentration, mobility, resistivity, and Hall coefficient of semiconductor materials. These parameters must be controlled in advance to understand the electrical properties of semiconductor materials. Therefore, the Hall effect test system is an important tool for understanding and researching semiconductor devices. and electrical properties of semiconductor materials.

 

The experimental results are automatically calculated by the software, and parameters such as Bulk Carrier Concentration, Sheet Carrier Concentration, Mobility, Resistivity, Hall Coefficient, and Magnetoresistance can be obtained at the same time.

 

The DX-320 effector specially developed for this instrument system integrates a constant current source, a six and a half microvolt meter and a complex switching relay-switch for Hall measurement, which greatly reduces the connection and operation of the experiment. DX-320 can be used as a constant current source and microvoltmeter alone.

 

Technique Data of DX-1000L Hall Effect Test System

 

Physical parameters Carrier concentration 5*1012 ~ 51*1020cm-3
mobility 0.1~108cm2/volt*sec
Resistivity range 5*10-5~5*102Ω.cm
Resistance range 10 m Ohms~ 6MOhms
Hall coefficient ±1*10-2~±1*106cm3/C
Magnetic field environment Magnet type Variable electromagnet
Magnetic field strength The maximum magnetic field is 20000Gs when the distance between N and S is 10mm;
N, S maximum 13000 Gauss at 20mm spacing;
The maximum magnetic field is 10000 gauss when the distance between N and S is 30mm;
Uniform area: When the air gap is 60mm, the diameter is 10mm and the uniformity range is 1%.
minimum resolution 0.1GS
Magnetic field range 0-1T
Optional magnetic field environment Customization is available
Electrical parameters Sample current 0.05uA~50mA (adjust 0.1nA)
Measure voltage 0.1uV~30V
Temperature environment Temperature adjustment 0.1K
Warm zone 78K-325K, 4K-325K (optional)
Testable materials Semiconductor material SiGe, SiC, InAs, InGaAs, InP, AlGaAs, HgCdTe and ferrite materials, etc.
low resistance material Graphene, metals, transparent oxides, weakly magnetic semiconductor materials, TMR materials, etc.
High resistance material Semi-insulating GaAs, GaN, CdTe, etc.

 

 

Parameters of each component:

 

High precision electromagnet:

 

  1. Pole diameter 100mm;
  2. The maximum magnetic field is 20000Gs when the air gap is 10mm;
  3. The maximum magnetic field is 13000 Gauss when the air gap is 20mm;
  4. The maximum magnetic field is 10000 gauss when the air gap is 30mm;
  5. Uniform area: when the spacing is 60mm, the diameter is 10mm, and the uniformity range is 1%;
  6. Weight 110 kg, including bracket and wheels.

 

High-precision bipolar constant current power supply

 

  1. Output: ±10A±80V;
  2. Power: 800W;
  3. The power supply output current can continuously change between positive and negative rated maximum current;
  4. The current can smoothly cross the zero point without switching commutation;
  5. Four-quadrant operation of output current and voltage (suitable for inductive loads);
  6. The current change rate can be set in the range of 0.0007~0.3 F.S./s (F.S. is the rated maximum output current);
  7. Current stability: better than ±25ppm/h (standard type); better than ±5ppm/h (high stability type);
  8. Current accuracy: ± (0.01% set value + 1mA)
  9. Current resolution: 20 bits, for example, 15A power supply, the current resolution is 0.03mA;
  10. Source effect: ≤ 2.0×10-5 F.S. (when the power supply voltage changes by 10%, the output current changes);
  11. Load effect: ≤ 2.0×10-5 F.S. (when the load changes by 10%, the output current changes);
  12. Current ripple (RMS): less than 1mA.


High precision gauss meter:

 

  1. Accuracy: ±0.30% of reading;
  2. Resolution: 0.01mT Range: 0-3T;
  3. Probe thickness: 1.0mm;
  4. Length: 100mm digital;
  5. Rs-232 interface data reading software with GP3 probe;
  6. All-aluminum non-magnetic bracket 5-70mm adjustable.

 

Cryostat:

 

  1. 80K-293K high and low temperature vacuum container;
  2. DX301 thermostat temperature control (65k-600k);
  3. Vacuum pump K25 vacuum pump.

 

Constant current source and test table

 

  1. Constant current source range: ±50nA-±50mA;
  2. Resolution 0.1nA, continuously adjustable within the range;
  3. High-precision voltage data acquisition instrument range 0. 1uV-30V;
  4. Accuracy: 0.01%;
  5. Built-in test matrix conversion card;
  6. Ohmic contact kits Make kits based on ohmic contacts of different materials.

 

Introduction of control software:

 

One-button measurement operating system, you only need to set a few sample parameters and the required temperature, and then you can measure automatically with one button, no need to keep an eye on it. When measuring, you only need to set the current passing through the sample, the magnetic field size of the magnetic field environment where the sample is located, and the thickness of the sample to measure. If you need to control the temperature, turn on the temperature setting to set the required temperature, and select the output power to control the temperature. Temperature control takes a short period of time (about 1 minute). After the temperature is stable, various parameters at this temperature can be measured. The data can be plotted and exported to EXCEL for post-processing and use.

 

Software Interface of Hall Effect Measurement System

 

DX-1000L Low Temperature Hall Effect Test System consists of an electromagnet, electromagnet power supply, high-precision constant current source and high-precision voltmeter, Hall effect sample holder, standard sample, high and low temperature Dewar, temperature controller, and system software.
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