DX-100 Hall Effect Measurement Equipment
DX-100 Hall Effect Measurement Equipment is used to measure important parameters such as carrier concentration, mobility, resistivity, Hall coefficient and other important parameters. These parameters are necessary to understand the electrical properties of semiconductor materials, so the hall measurement equipment is a necessary tool for understanding and studying the electrical properties of semiconductor devices and semiconductor materials.
DX-320 System SourceMeter
The DX-320 effect meter specially developed for this instrument system assembles a constant current source and a switch (a six-and-a-half microvoltmeter and a Hall-complex switching relay) into one. Greatly reduced the connection and operation of the experiment. The DX-320 can be used alone as a constant stream and a microvolt.
Parameters of DX-100 hall effect measurement equipment:
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Physical parameters |
Carrier concentration |
10³cm⁻³ - 10²³cm⁻³ |
| Mobility | 0 .1 cm²/ volt*sec - 10⁸cm²/ volt*sec | |
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Resistivity range |
10⁻⁷ Ohm*cm - 10¹² Ohm*cm | |
| Hall voltage | 1 uV - 3V | |
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Hall coefficient |
10⁻⁵ - 10²⁷cm³/ C | |
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Testable material type |
Semiconductor material | SiGe, SiC, InAs, InGaAs, InP,AlGaAs, HgCdTe and ferrite materials etc. |
| low resistance material | Graphene, metals, transparent oxides, weakly magnetic semiconductor materials, TMR materials, etc. | |
| high resistance material | Semi-insulating GaAs, GaN, CdTe, etc. | |
| Material Conductive Particles | Type P and Type N testing of materials | |
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Magnetic field environment |
Magnet Type | Variable electromagnet |
| Magnitude of magnetic field |
1900mT (The pole pitch is 10mm) 600mT (The pole pitch is 50mm) |
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| Uniform area: 1% | Minimum resolution: 0.1Gs | |
| Optional magnetic environment | The electromagnet of relevant magnetic size can be customized according to the needs of customers | |
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Electrical parameters |
Current source | 50.00nA- 50.00mA |
| Current source resolution | 0.0001uA | |
| Measuring voltage | 0 ~ ±3V | |
| Voltage measurement resolution | 0.0001 mV | |
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Other Accessories |
Shading | Extern ally installed light-shielding parts make the test material more stable |
| Sample size |
normal 10mm * 10mm Maximum 16mm * 16mm |
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| Box cabinet | 600*600*1000mm | |
| Test piece | Hall effect of Institute of Semiconductors, Chinese Academy of Sciences Standard test samples and data: 1 set (Si, Ge, GaAs, lnSb) |
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| Making ohmic contacts | Electric soldering iron, indium chip, solder, enameled wire, etc. | |
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One-button automatic measurement can be performed without the need for human operation after the test is started |
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The software can perform I-V curve and BV curve |
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Set in software for automatic temperature measurement |
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The experimental results are measured, and the data will be temporarily saved in the software. If long-term storage is required, the data can be exported to an EXCEL table to facilitate later data processing. |
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Provide the Hall effect standard test samples and data of the Institute of Semiconductors, Chinese Academy of Sciences: 1 set |
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Testable samples of the hall effect measurement:
High And Low Temperature Selection of the Hall Effect Measurement Equipment
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System model |
Test temperature zone |
System Test Index |
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DX-100 High and Low Temperature Hall Effect Test System |
80K ~ 500K (high and low temperature, temperature adjustment 0.1K) |
Minimum resolution: 0.1GS |
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DX-100H High-Temperature Hall Effect Test System |
300K ～ 500K (high temperature, temperature adjustment 0.1K) |
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DX-100L Low-Temperature Hall Effect Test System |
80K ～ 300K (low temperature, temperature adjustment 0.1K) |
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DX-200L Low-Temperature Hall Effect Test System |
4K ～ 300K (low temperature, temperature adjustment 0.1K) |
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DX-500 High and Low Temperature Hall Effect Test System |
80K ~ 800K (high and low temperature, temperature adjustment 0.1K) |
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DX-500H High-Temperature Hall Effect Test System |
300 K ~ 800 K (high temperature, temperature adjustment 0.1K) |
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