DX-2012M-2
DX-2012M-3
DX-2012M-1

Silicon Steel Material Automatic Measuring Device

Test accuracy and repeatability technical indicators (refer to the standard sample of the square circle):

 

Under 50Hz frequency

Ss(%)

Ps(%)

Bm(%)

Hm(%)

μa(%)

δ(%)

Uncertainty

1.0

1.0

0.5

0.5

1.0

2.0

Repeatability (constant temperature)

±0.5

±0.5

±0.3

±0.3

±0.5

±1.0

 

 

Technical Parameter Description of Hardware

 

Built-in testing power supply technical specifications:

  1.  Input:220V±20V/10A;
  2.  Input Power: 500VA Sine Wave
  3.  Input Frequency: 40Hz~1000Hz, Fineness less than one ten thousandth of the set value
  4.  Frequency error: within ± 0.05% of the set value
  5.  Output voltage: 0- 10- 50- 100- 200V (effective value) with four automatic outputs
  6.  Output current: 0- 20- 20- 10A (peak value) with four automatic outputs
  7.  Voltage distortion: better than 0.5%
  8.  Voltage stability: better than 0.2%
  9.  Signal generation method: DDS digital frequency synthesis method, D/A converter: 16 bit bipolar

 

System Parameters:

  1.  Processor: 32-bit ARM embedded high-speed processor
  2.  Interface: RS232, can be connected to a microcomputer for upper computer software control

 

Sampling technology parameters: A/D converter 1MHz, dual channel 16-bit synchronous analog-to-digital converter, automatic replacement of sampling values.

 

Measurement accuracy (preheated for 10 minutes at 23 ℃ ± 5 ℃, 30-75% RH environment without external magnetic field interference).

  1.  Magnetic induction B locking accuracy: ± 0.5%.
  2.  Measurement accuracy of magnetic induction B: ± (0.2% + 0.1% × (Vf/Vr-1) (Vf: Induced voltage sampling range full range delta, Vr: Measurement peak of induced voltage (Vf/Vr-1) ≤ 2 (30V, 300V voltage sampling gear).
  3.  Magnetic field H locking accuracy: ± 0.5%; Measurement accuracy of magnetic field H: ± (0.2%+0.1% x (If/Ir-1)) (If: Full range value of excitation current sampling gear, Ir:  Peak value of excitation current measurement (If/Ir-1) ≤ 2 (300mA, 3000mA, 30000mA current sampling gear).
  4.  (Specific total loss (Ps): ± (1.0+(Φ/90 °) × 0.05 × tan (Φ))% (Φ: Phase angle between induced voltage and excitation current).

 

Research and development of industrial control computers and HP laser printers are standard equipment.

 

 

DX-2012M software testing function (Chinese and English testing interface and report selection)

 

DX-2012M silicon steel testing software, the underlying software is written in AMR microcontroller language, and the upper computer software is developed in C #, which can directly perform program control operations. The main functions are as follows:

  1.  Connected to a microcomputer for automatic control and saving of test data;
  2.  Provide sorting function for important parameters (Br, Bm, Hc, Hm, Ps, ua);
  3.  Accurate measurement: frequency f, peak value of primary current (effective value), peak value of secondary voltage (effective value), active power, and apparent power;
  4.  Accurate measurement: remanence Br, coercivity Hc, amplitude magnetic permeability ua, loss angle δ, and specific total loss Ps;
  5.  Accurate measurement: elastic permeability u', viscous permeability u'', inductive permeability uL, resistive permeability uR, Q value, and inductance constant AL;
  6.  Provide reports on test waveforms I-V-B, B-H hysteresis loops (clusters), AC u&B-H permeability curves and magnetization curves, and Ps-B specific total loss curves.
  7.  It has the functions of locking B, locking H, and locking frequency f testing, and can stack three or less sample curve reports for comparative analysis.

 

 

Introduction to Testing Performance (50W470 Non-oriented Silicon Steel is selected as the testing material)

 

 

Repetitive experiment (DX-2012M test repeatability)

 

Repeatability analysis: Frequency locked f without deviation, Bm locked (locked value of 1.500T) deviation: -0.2%

 

 No.

Bm(T)

Ps(W/kg)

ua(k)

Hc(A/m)

Br(T)

Hm(A/m)

δ(deg)

1

1.497

2.930

0.963

67.91

1.016

1237

7.042

2

1.497

2.929

0.9647

67.96

1.016

1235

7.054

3

1.497

2.927

0.9664

67.98

1.015

1233

7.065

4

1.497

2.930

0.9632

67.88

1.016

1237

7.043

5

1.497

2.931

0.9658

67.99

1.015

1233

7.058

6

1.497

2.930

0.9659

68.03

1.017

1233

7.066

7

1.497

2.931

0.9625

67.81

1.016

1238

7.037

8

1.497

2.927

0.9665

67.97

1.016

1232

7.064

Average Value

1.497

2.931

0.9648

67.94

1.016

1234.75

7.0536

Maximum Value

1.497

2.932

0.9665

68.04

1.017

1249

7.066

Minimum Value

1.497

2.927

0.9625

67.81

1.015

1232

7.037

Positive Deviation

----

+0.03%

+0.181%

+0.13%

+0.098%

+0.26%

+0.176%

Negative Deviation

----

-0.13%

-0.233%

-0.19%

-0.098%

-0.22%

-0.235%

 

 

Test the 0.1T~1.5TBH curve cluster diagram, with clusters of the same brand and frequency (less than 256), and the operation is exceptionally convenient.

 

BH magnetization curve and permeability curve of the sample under 50Hz conditions (the smoother the curve with more test points)

 

Loss curve of the sample under 50Hz conditions

 

Loop clusters obtained from testing samples at different frequencies under the same Bm conditions

 

The magnetization curve and permeability curve were obtained by testing samples at different frequencies under the same Bm condition

 

Loss curves were obtained by testing samples at different frequencies under the same Bm conditions

 

DX-2012M Silicon Steel Material Automatic Measuring Device is suitable for measuring the incoming inspection of various hot-rolled, cold-rolled oriented, and non oriented silicon steel materials. 
It can be configured with standard Epstein square coils to meet the requirements of national standards GB/T3655-2000, GB/T 13789, and IEC 404-2. It can also be used to directly test the AC magnetic properties of soft magnetic material cores in the frequency range of 40Hz~1kHz.
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